X-ray Fluorescence Spectroscopy (XRF) is a non-destructive analytical technique used to determine the elemental composition of materials. It works by measuring the characteristic secondary (fluorescent) X-rays emitted from a sample when it is excited by a primary X-ray source.
XRF is widely used across industries for material identification, quality control, and environmental monitoring. It supports rapid, accurate analysis of solids, liquids, powders, and thin films with minimal sample preparation. The technique is suitable for metals, minerals, polymers, ceramics, and more, and can detect elements from sodium to uranium at concentrations ranging from parts per million to percent levels.
