SAS-JMP Software is one of the most-commonly used data analysis tools. It was created in 1989 to empower scientists and engineers to explore data visually. It links dynamic data visualization with powerful statistics.
SO/IEC 17025 covers the general requirements for the competence of testing and calibration laboratories. This new standard is a comprehensive expression of the requirements that testing, and calibration laboratories need to meet in order to demonstrate that they operate a relevant and recognized quality system, are technically competent and are able to generate technically valid results.
This course intends to equip the participant with a working knowledge of the impacts of GLP through a thorough examination of the basics of the history of GLPs and the regulations. The course intends to provide a review of all the requirements of Good Laboratory Practices (GLP) regulations for facilities engaged in regulated Safety Testing.
Fractography is the study of fracture surfaces in-order-to determine the relation between the microstructure and the mechanism(s) of crack initiation and propagation and, eventually, the root cause of the fracture.
This course covers lecture on theories and application of emission microscopy techniques such as Photon Emission Microscopy, Thermal Emission Microscopy and Optical Beam Induced Resistance Change. This also involves hands-on operation of IR-OBIRCH. Practical tips based on actual experience of the resource speaker will be shared in the training.
This course is a lecture-discussion on the failure analysis techniques in semiconductor devices. This will cover topics from electrical characterization of MOSFET (Igss, Idss, Bvdss etc), non-destructive, destructive analysis up to the application of Photon emission, Optical Beam Induced Resistance Change (OBIRCH), Thermal Emission to failure isolation. Practical tips based on actual experience of the resource speaker will be shared in the training.