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Atomic Force Microscopy (AFM) Analysis

Atomic Force Microscopy (AFM) analysis is a characterization technique with a resolution that can measure in fractions of a nanometer. It is one of the most important techniques for imaging on the nanometer scale and has the advantage of imaging almost any type of surface, including polymers, ceramics, composites, glass, and biological samples.

Energy Dispersive X-ray Nanoanalysis (EDX)

Energy Dispersive X-Ray Spectroscopy (EDX) Analysis is a characterization technique that can be used to find the chemical composition of materials down to a spot size of a few microns, and to create element composition maps over a much broader raster area. Together, these capabilities provide fundamental compositional information for a wide variety of materials.