Material Science

This course provides the participants with an advanced knowledge on Energy Dispersive X-ray Spectroscopy and desires to expand their knowledge on data interpretation in order to equip themselves for a more accurate qualitative and quantitative analysis.

X-Ray diffraction is a versatile analytical technique for examining crystalline solids, which include ceramics, metals, electronic materials, geological materials, organics, and polymers. These materials may be powders, single crystals, multilayer thin films, sheets, fibers, or irregular shapes, depending on the desired
measurement.

Particle Size Analysis (PSA101) is a lecture-discussion of the analytical technique used in measuring the distribution of sizes in a sample of solid or liquid particulate material. In this training course, the principles and applications, and techniques used in particle size analysis will be discussed. PSA101 will also discuss the basic operations of the particle size analyzer.

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Advance Surface Analysis Techniques (SA101) is an introduction to various surface analytical techniques such as AFM, FTIR, RAMAN, EDS, XRF, WDS, XPS, AES, TOF-SIMS, and Contact Angle. This will give participants the basic knowledge of the technique and let them know which technique is more appropriate for certain problems and sample situations. Teach them what outcome to expect from the technique, its applicability and usefulness, and the basic data interpretation.

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Material Science and Engineering (MSE101) is designed to give participants from the semiconductor and electronics industry what material science and engineering is all about and its application to semiconductor materials and electronics. It also aims to give the participant basic but important material science concepts which they can apply to their work.

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