Atomic Force Microscopy is a high-resolution imaging technique used to analyze surface topography and mechanical properties at the nanoscale. It operates by scanning a sharp probe across a sample surface to detect atomic-level interactions, generating detailed 3D maps of surface features.
AFM is suitable for a wide range of materials, including polymers, semiconductors, biomaterials, and nanostructures. It supports multiple imaging modes—such as contact, tapping, and non-contact—allowing flexibility in sample characterization without the need for conductive coatings.
