Energy Dispersive X-ray Spectroscopy (EDS or EDX), when integrated with Scanning Electron Microscopy (SEM), enables elemental analysis of materials at the microscale. As the electron beam interacts with the sample, it generates characteristic X-rays that are detected and analyzed to determine the elemental composition of the material.
This technique is widely used for identifying unknown materials, mapping elemental distributions, and supporting failure analysis. It is non-destructive, requires minimal sample preparation, and can detect nearly all elements (except hydrogen and helium). SEM-EDS is applicable to a broad range of materials including metals, ceramics, polymers, and composites.
