Scanning Electron Microscopy (SEM) is a powerful imaging technique that delivers high-resolution visualization of surface morphology and microstructures at the micro- and nanoscale. By directing a focused electron beam across a sample, SEM captures detailed images based on electron-sample interactions, revealing topographical, compositional, and crystallographic features.
SEM is essential across various industries and research fields—including materials science, electronics, biology, and forensics. It accommodates a wide range of sample types such as metals, polymers, ceramics, and biological specimens. For enhanced analytical capabilities, SEM can be integrated with complementary techniques like Energy Dispersive X-ray Spectroscopy (EDS) and Electron Backscatter Diffraction (EBSD), enabling elemental and crystallographic analysis.
