Atomic Force Microscopy (AFM) is a high-resolution characterization technique capable of measuring fractions of a nanometer. It is essential for…
Read More…Failure Analysis and Material Characterization
Atomic Force Microscopy (AFM) is a high-resolution characterization technique capable of measuring fractions of a nanometer. It is essential for…
Read More…Differential scanning calorimetry (DSC) analysis is a thermoanalytical technique in which the difference in the amount of heat required to…
Read More…Electron Backscatter Diffraction (EBSD) Analysis is a characterization technique used to determine the crystalline structure and crystallographic orientation of a…
Read More…Energy Dispersive X-ray Spectroscopy (EDS) is a powerful analytical technique used to determine the elemental composition of materials. By focusing…
Read More…Some of the key applications of these techniques are: These techniques are crucial in industries like semiconductors, electronics, and materials…
Read More…Hybrid Ion Milling is a precise technique used to remove the top amorphous layer of a material, revealing a pristine…
Read More…Infrared Optical Beam Induced Resistance Change (IR-OBIRCH) analysis is a powerful fault localization technique for integrated circuits. It is widely…
Read More…Non-conductive samples often experience a charging effect due to the accumulation of electrons on their surface, which can interfere with…
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Atomic Force Microscopy (AFM) is a high-resolution characterization technique capable…
Read More…Differential scanning calorimetry (DSC) analysis is a thermoanalytical technique in…
Read More…Electron Backscatter Diffraction (EBSD) Analysis is a characterization technique used…
Read More…Energy Dispersive X-ray Spectroscopy (EDS) is a powerful analytical technique…
Read More…Infrared Optical Beam Induced Resistance Change (IR-OBIRCH) analysis is a…
Read More…Restriction of Hazardous Substances (RoHS) is a directive on the…
Read More…Scanning Electron Microscopy (SEM) imaging is a versatile characterization technique…
Read More…Thermal Emission Microscopy is a semiconductor failure analysis technique that…
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Some of the key applications of these techniques are: These…
Read More…Hybrid Ion Milling is a precise technique used to remove…
Read More…Non-conductive samples often experience a charging effect due to the…
Read More…Mechanical Cross Section is a critical failure analysis technique used…
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© Copyright 2025 NASAT Labs
NASAT Labs (Nanotech Analytical Services And Training Corp.) is the first independent nanotechnology laboratory in the Philippines. We provide failure analysis, material characterization, water and environmental testing, and technical trainings to diverse industries and the academe.