Atomic Force Microscopy (AFM) is a high-resolution characterization technique capable of measuring fractions of a nanometer. It is essential for imaging at the nanometer scale and can be used on various surfaces, including polymers, ceramics, composites, glass, biological samples, and more.
- High Resolution: Measures at the nanometer scale for detailed imaging.
- Versatile Applications: Suitable for polymers, ceramics, composites, glass, and biological samples.
- Comprehensive Surface Analysis: Applicable to almost any type of surface.
Applications
Our AFM services are ideal for researchers and industries needing precise imaging and analysis of different materials and surfaces.
For more information about our AFM analysis services, please contact us. We are here to support your research and industrial needs.