Atomic Force Microscopy (AFM) analysis is a characterization technique with a resolution that can measure in fractions of a nanometer....
Read More...Atomic Force Microscopy (AFM) analysis is a characterization technique with a resolution that can measure in fractions of a nanometer....
Read More...Differential scanning calorimetry (DSC) analysis is a thermoanalytical technique in which the difference in the amount of heat required to...
Read More...Electron Backscatter Diffraction (EBSD) Analysis is a characterization technique used to determine the crystalline structure and crystallographic orientation of a...
Read More...Energy Dispersive X-Ray Spectroscopy (EDX) or (EDS) Analysis is a characterization technique that can be used to find the chemical...
Read More...Some of the key applications of these techniques are: Topside electronic de-processing – enabled by the advanced angular control and...
Read More...Ion milling is the process of removing the top amorphous layer on a material to reveal the pristine sample surface...
Read More...Infrared Optical Beam Induced Resistance Change (IR-OBIRCH) analysis is a very powerful fault localization technique for Integrated Circuits. In semiconductor...
Read More...Non-Conductive samples often have a charging effect from electrons building up on the surface causing issues with collecting a good...
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NASAT Labs (Nanotech Analytical Services And Training Corp.) is the first independent nanotechnology laboratory in the Philippines. We provide failure analysis, material characterization, water testing, environmental testing, and technical trainings to the semiconductor, electronics and allied industries.