Advance Surface Analysis Techniques (SA101)

About this Training

This course is an introduction to various surface analytical techniques such as AFM, FTIR, RAMAN, EDS, XRF, WDS, XPS, AES, TOF-SIMS, and Contact Angle. This will give participants the basic knowledge of the technique and to let them know which technique is more appropriate for certain problem and sample situation. Teach them what outcome to expect from the technique, its applicability and usefulness and the basic data interpretation.

About the Speaker
Engr. Marlon Llana, M. Sce. Eng.
Technical and Operations Director, NASAT Labs, NASAT Labs
Eng’r. Llana has a B.S. and a Masters’ degree in Chemical Engineering from Mapua Institute of Technology. He is currently pursuing a doctorate degree in the same institution. He has over 20 years of experience in the semiconductor industry in the field of Quality, R&D, Laboratory Operation, Electro-plating, Failure Analysis and Reliability having worked for Philips Semiconductors, SunPower Mfg. Ltd., International Rectifier, and DECA Technologies. He is also a technical assessor of DTI-PAB for ISO/IEC17025 and is a member of DTI Technical committee for nanotechnology.

Webinar Schedule

  • No upcoming training events are available for this course
  • Customer-site trainings and private webinar trainings are available.
    (Contact us for more information.)
    • Customer-site trainings and private webinar trainings are available.
      (Contact us for more information.)