Infrared Optical Beam Induced Resistance Change (IR-OBIRCH) analysis is a very powerful fault localization technique for Integrated Circuits. In semiconductor failure analysis, IR-OBIRCH analysis can localize metal shorts, active area shorts, shorts in source or drain wells, gate oxide pinholes, and poly shorts.
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© Copyright 2024 NASAT Labs
NASAT Labs (Nanotech Analytical Services And Training Corp.) is the first independent nanotechnology laboratory in the Philippines. We provide failure analysis, material characterization, water testing, environmental testing, and technical trainings to the semiconductor, electronics and allied industries.
