This course is a lecture and hands-on discussion on the materialographic preparation techniques such as cross sectioning, grinding, polishing, lapping, mechanical delayering, and ion milling. The participant will be able use a precision grinder polisher and learn how to prepare the samples precisely and with high quality. They will learn the theory and various method of sample preparation. They will also utilize a more advance technique using Ion Milling to prepare soft and difficult samples prior inspection. Thus, also have the opportunity to learn the basics of SEM (Scanning Electron Microscope) imaging and the use of Electron Backscatter Diffraction (EBSD).
