Scanning Electron Microscopy (SEM)

About this Service

Scanning Electron Microscopy (SEM) is a characterization technique used to analyze different kinds of samples such as membranes, filters, coins or even biological samples like plant leaf, ants, etc. The Scanning Electron Microscope uses electron beams to capture an image for observation of surface morphology, topography, cracks, failures, and any kind of microscopic observation from microns to the nanoscale level.