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Advance Surface Analysis Techniques (SA101)

Advance Surface Analysis Techniques (SA101) is an introduction to various surface analytical techniques such as AFM, FTIR, RAMAN, EDS, XRF, WDS, XPS, AES, TOF-SIMS, and Contact Angle. This will give participants the basic knowledge of the technique and let them know which technique is more appropriate for certain problems and sample situations. Teach them what outcome to expect from the technique, its applicability and usefulness, and the basic data interpretation.

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Reliability Statistics (RS101)

Reliability Statistics (RS101) is a 3-day, application-oriented course on statistical methods. Designed for the practitioner, this course covers the main statistical methods used in reliability and life data analysis. Real-life exercises will be given, and the use of Statistical software will be emphasized. Actual data can be used and analyzed. Consultation shall be provided to the participants.

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RoHS Legislation, Methods of Analysis and Testing (ROH101)

RoHS Legislation, Methods of Analysis, and Testing (ROH101) provides an overview of the requirements of RoHS and WEEE directives. It covers the acceptable methods of analysis and a brief background of ICP-OES, GC-MS, and UV-Vis. The theory and hands-on exercise on the operation of XRF as a current popular method for RoHS screening will also be covered. At this stage, the participant can bring their own sample for testing.

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Reliability Engineering and Management (REL101)

Reliability Engineering and Management (REL101) is a lecture-discussion on the fundamentals of Reliability Engineering and Management of the semiconductor components. This course is recommended for those engaged in reliability testing activities who want to understand the fundamental concepts of semiconductor component reliability and management.

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Infrared Optical Beam Induced Resistance Change (IR OBIRCH) (OB101)

Infrared Optical Beam Induced Resistance Change (IR OBIRCH) (OB101) covers lectures on theories and application of emission microscopy techniques such as Photon Emission Microscopy, Thermal Emission Microscopy and Optical Beam Induced Resistance Change. This also involves hands-on operation of IR-OBIRCH. Practical tips based on actual experience of the resource speaker will be shared in the training.

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