Analytical tools

X-ray Fluorescence Spectroscopy (XRF)

September 9, 2020 by growers

X-ray Fluorescence Spectroscopy (XRF) is an analytical technique that uses x-rays to scan samples in order to determine their elemental composition.

X-ray Fluorescence Spectroscopy (XRF) can also be used as a RoHS (Restriction on Hazardous Substances) screening tool. Kindly see our RoHS Screening Analysis using XRF service (Click Here).

Capable Elements:

Aluminum to Uranium

Applications:

Semiconductors and Electronics (e.g. Integrated circuit (IC), LED, Pins, etc.)
Environmental Analysis (e.g. soil, sand, plant leaves, etc.)
Metallurgy and Mining (e.g. Coating, Alloy, Gold, etc.)
Polymers (e.g. plastics, packaging, toys, etc.)

Sample Types and Requirements:

Solid – Min Size: 1.2mm (Millimeters)
Liquid – 5mg (Milligrams)
Powder – 5g (Grams)

Equipment used:

Horiba MESA-50 (Cl ick Here)

Infrared Optical Beam Induced Resistance Change (IR-OBIRCH) Analysis

September 9, 2020 by growers

Infrared Optical Beam Induced Resistance Change (IR-OBIRCH) analysis is a powerful fault localization technique for integrated circuits. It is widely used in semiconductor failure analysis to precisely localize various types of shorts, including: Poly shorts, Metal shorts, Active area shorts, Shorts in source or drain wells, Gate oxide pinholes, etc.

Precision Fault Localization: Accurately identifies faults in integrated circuits.
Comprehensive Analysis: Detects a wide range of shorts and defects.
Advanced Technology: Utilizes cutting-edge IR-OBIRCH techniques for reliable results.

Applications

Our IR-OBIRCH analysis services are essential for semiconductor failure analysis, providing detailed insights into fault localization and helping improve the reliability of integrated circuits.

For more information about our IR-OBIRCH analysis services, please contact us. We are here to support your semiconductor analysis needs.

Atomic Force Microscopy (AFM) Analysis

September 9, 2020 by growers

Atomic Force Microscopy (AFM) is a high-resolution characterization technique capable of measuring fractions of a nanometer. It is essential for imaging at the nanometer scale and can be used on various surfaces, including polymers, ceramics, composites, glass, biological samples, and more.

High Resolution: Measures at the nanometer scale for detailed imaging.
Versatile Applications: Suitable for polymers, ceramics, composites, glass, and biological samples.
Comprehensive Surface Analysis: Applicable to almost any type of surface.

Applications

Our AFM services are ideal for researchers and industries needing precise imaging and analysis of different materials and surfaces.

For more information about our AFM analysis services, please contact us. We are here to support your research and industrial needs.

Energy Dispersive X-ray Nanoanalysis (EDX)

September 9, 2020 by growers

Energy Dispersive X-ray Spectroscopy (EDS) is a powerful analytical technique used to determine the elemental composition of materials. By focusing an electron beam onto a sample, EDS detects the characteristic X-rays emitted by each element, allowing for precise identification and quantification.

Key Features of EDS Analysis:

High Precision: Analyze chemical composition down to a spot size of a few microns.
Element Mapping: Create detailed maps showing the distribution of elements over larger areas.
Versatility: Applicable to a wide range of materials, from metals and ceramics to biological samples.

At NASAT Labs, our EDS Analysis services provide fundamental compositional information essential for various applications, including research, quality control, and failure analysis.