Analytical tools

X-ray Fluorescence Spectroscopy (XRF) is an analytical technique that uses x-rays to scan samples in order to determine their elemental composition.

X-ray Fluorescence Spectroscopy (XRF) can also be used as a RoHS (Restriction on Hazardous Substances) screening tool. Kindly see our RoHS Screening Analysis using XRF service (Click Here).

Capable Elements:

• Aluminum to Uranium

Applications:

• Semiconductors and Electronics (e.g. Integrated circuit (IC), LED, Pins, etc.)
• Environmental Analysis (e.g. soil, sand, plant leaves, etc.)
• Metallurgy and Mining (e.g. Coating, Alloy, Gold, etc.)
• Polymers (e.g. plastics, packaging, toys, etc.)

Sample Types and Requirements:

• Solid – Min Size: 1.2mm (Millimeters)
• Liquid – 5mg (Milligrams)
• Powder – 5g (Grams)

Equipment used:

• Horiba MESA-50 (Click Here)

Infrared Optical Beam Induced Resistance Change (IR-OBIRCH) analysis is a very powerful fault localization technique for Integrated Circuits. In semiconductor failure analysis, IR-OBIRCH analysis can localize metal shorts, active area shorts, shorts in source or drain wells, gate oxide pinholes, and poly shorts.

Atomic Force Microscopy (AFM) analysis is a characterization technique with a resolution that can measure in fractions of a nanometer. It is one of the most important techniques for imaging on the nanometer scale and has the advantage of imaging almost any type of surface, including polymers, ceramics, composites, glass, and biological samples.